Thilo Glatzel
|
Postdoc PhD in Physics office 3.04 tel +41 (0)61 267 3730 (office) Private Homepage |
 |
Research interests
ncAFM, KPFM
Publications
| B. Such, T. Glatzel, S. Kawai, E. Meyer, R. Turansky, J. Brndiar and I. Stich Interplay of the tip-sample junction stability and image contrast reversal on a Cu(111) surface revealed by the 3D force field Nanotechnology, 23, (2012), 045705, pdf. |
| S. Fremy, S. Kawai, R. Pawlak, Th. Glatzel, A. Baratoff and E. Meyer Three-dimensional dynamic force spectroscopy measurements on KBr(001): atomic deformations at small tip-sample separations Nanotechnology, 23, (2012), 055401, pdf. |
| R. Pawlak, S. Kawai, S. Fremy, T. Glatzel and E. Meyer High-resolution imaging of C60 molecules using tuning-fork-based non-contact atomic force microscopy J. Phys.: Cond. Matter, (24), (2012), 084005, pdf. |
| S. Kawai, S. Hafizovic, Th. Glatzel, A. Baratoff, and E. Meyer Rapid reconstruction of a strong nonlinear property by a multiple lock-in technique Phys. Rev. B, 85, (16), (2012), 165426, pdf. |
| Th. Glatzel, L. Zimmerli, S. Kawai, E. Meyer, L.-A. Fendt and F. Diederich Oriented growth of porphyrin-based molecular wires on ionic crystals analysed by nc-AFM Beilstein J. Nanotechnol. 2, 34-39, (2011)., 2, (2011), 34-39, pdf. |
| S. Kawai, Th. Glatzel, S. Koch, A. Baratoff, and E. Meyer Interaction-induced atomic displacements revealed by drift-corrected dynamic force spectroscopy Phys. Rev. B, 83, (3), (2011), 035421, pdf. |
| G. Fessler, I. Zimmermann, T. Glatzel, E. Gnecco, P. Steiner, R. Roth, T. D. Keene, S.-X. Liu, S. Decurtins, and E. Meyer Orientation dependent molecular friction on organic layer compound crystals Appl. Phys. Lett., 98, (8), (2011), 083119, pdf. |
| T. Trevethan, B. Such, T. Glatzel, S. Kawai, A. L. Shluger, E. Meyer, P. de Mendoza, and A. M. Echavarren Organic Molecules Reconstruct Nanostructures on Ionic Surfaces Small, 7, (9), (2011), 1264, pdf. |
| S. Kawai, R. Pawlak, Th. Glatzel, and E. Meyer Systematic measurement of pentacene assembled on Cu(111) by bimodal dynamic force microscopy at room temperature Phys. Rev. B, 84, (8), (2011), 085429, pdf. |
| S. Kawai, F. Federici Canova, Th. Glatzel, A. S. Foster, and E. Meyer Atomic-scale dissipation processes in dynamic force spectroscopy Phys. Rev. B, 84, (11), (2011), 115415, pdf. |
| Y. Fleming, T. Wirtz, U. Gysin, T. Glatzel, U. Wegmann, E. Meyer, U. Maier and J. Rychen Three dimensional imaging using Secondary Ion Mass Spectrometry and Atomic Force Microscopy Appl.Surf. Sci., 258, (4), (2011), 1322, pdf. |
| G. Elias, T. Glatzel, E. Meyer, A. Schwarzman, A. Boag and Y. Rosenwaks The role of the cantilever in Kelvin probe force microscopy measurements Beilstein J. Nanotechnol., 2, (2011), 252, pdf. |
| R. Pawlak, S. Kawai, S. Fremy, T. Glatzel and E. Meyer Atomic-scale mechanical properties of orientated C60 molecules revealed by noncontact atomic force microscopy ACS Nano, 5, (8), (2011), :6349-54, pdf. |
| S. Kawai, Th. Glatzel, S. Koch, B. Such, A. Baratoff, and E. Meyer Ultrasensitive detection of lateral atomic-scale interactions on graphite (0001) via bimodal dynamic force measurements Phys. Rev. B, 81, (8), (2010), 085420, pdf. |
| S. Kawai, Th. Glatzel, H.-J. Hug, and E. Meyer Atomic contact potential variations of Si(111)-7 × 7 analyzed by Kelvin probe force microscopy Nanotechnology, 21, (24), (2010), 245704, pdf. |
| B. Such, Th. Glatzel, S. Kawai, S. Koch, and E. Meyer Three-dimensional force spectroscopy of KBr(001) by tuning fork-based cryogenic noncontact atomic force microscopy J. Vac. Sci. Technol. B, 28, (3), (2010), C4B1, pdf. |
| L. Gross, R. R. Schlittler, G. Meyer, L.-A. Fendt, F. Diederich, Th. Glatzel, S. Kawai, S. Koch, and E. Meyer Contacting self-ordered molecular wires by nanostencil lithography J. Vac. Sci. Technol. B, 28, (3), (2010), C4D34, pdf. |
| R. Roth, Th. Glatzel, P. Steiner, E. Gnecco, A. Baratoff, E. Meyer Multiple Slips in Atomic-Scale Friction: An Indicator for the Lateral Contact Damping Tribology Letters, 39, (1), (2010), 63, pdf. |
| B. Such, T. Trevethan, Th. Glatzel, S. Kawai, L. Zimmerli, E. Meyer, A. L. Shluger, C. H. M. Amijs, P. de Mendoza, and A. M. Echavarren Functionalized Truxenes: Adsorption and Diffusion of Single Molecules on the KBr(001) Surface ACS Nano, 4, (6), (2010), 3429, pdf. |
| E. Gnecco, A. Socoliuc, S. Maier, J. Gessler, Th. Glatzel, A. Baratoff and E. Meyer Dynamic superlubricity on insulating and conductive surfaces in ultra-high vacuum and ambient environment Nanotechnology, 20, (2009), 025501, pdf. |
| P. Steiner, R. Roth, E. Gnecco, A. Baratoff, S. Maier, Th. Glatzel, and E. Meyer Two-dimensional simulation of superlubricity on NaCl and highly oriented pyrolytic graphite Phys. Rev. B, 79, (2009), 045414, pdf. |
| Th. Glatzel, L. Zimmerli, S. Koch, S. Kawai, E. Meyer Molecular assemblies grown between metallic contacts on insulating surfaces Appl. Phys. Lett., 94, (2009), 3, pdf. |
| L. Nony, F. Bocquet, C. Loppacher and T. Glatzel On the relevance of the atomic-scale contact potential difference by amplitude-modulation and frequency-modulation Kelvin probe force microscopy Nanotechnology, 20, (26), (2009), 264014, pdf. |
| T. Glatzel, L. Zimmerli, S. Koch, B. Such, S. Kawai and E. Meyer Determination of effective tip geometries in Kelvin probe force microscopy on thin insulating films on metals Nanotechnology, 20, (26), (2009), 264016, pdf. |
| E. Meyer and T. Glatzel Novel Probes for Molecular Electronics Science, 324, (5933), (2009), 1397-1398, pdf. |
| S. Kawai, Th. Glatzel, S. Koch, B. Such, A. Baratoff, and E. Meyer Time-averaged cantilever deflection in dynamic force spectroscopy Phy. Rev. B, 80, (8), (2009), 085422, pdf. |
| S. Kawai, S. Maier, Th. Glatzel, S. Koch, B. Such, L. Zimmerli, L.-A. Fendt, F. Diederich, and E. Meyer Cutting and self-healing molecular wires studied by dynamic force microscopy Appl. Phys. Lett., 95, (2009), 103109, pdf. |
| P. Steiner, R. Roth, E. Gnecco, Th. Glatzel, A. Baratoff and E. Meyer Modulation of contact resonance frequency accompanying atomic-scale stick-slip in friction microscopy Nanotechnology, 20, (495701), (2009), 6, pdf. |
| S. Kawai, Th. Glatzel, S. Koch, B. Such, A. Baratoff, and E. Meyer Systematic Achievement of Improved Atomic-Scale Contrast via Bimodal Dynamic Force Microscopy Phys. Rev. Lett., 103, (2009), 220801, pdf. |
| G.H. Enevoldsen, T. Glatzel, M.C. Christensen, J.V. Lauritsen, and F. Besenbacher Atomic Scale Kelvin Probe Force Microscopy Studies of the Surface Potential Variations on the TiO2(110) Surface Phys. Rev. Lett., 100, (2008), 236104, pdf. |
| Sabine Maier, Leslie-Anne Fendt, Lars Zimmerli, Thilo Glatzel, Oliver Pfeiffer, Franc¸ois Diederich, and Ernst Meyer Nanoscale Engineering of Molecular Porphyrin Wires on Insulating Surfaces Small, 4, (8), (2008), 1115, pdf. |
| F. Bocquet and L. Nony and Ch. Loppacher and Th. Glatzel Analytical approach to the local contact potential difference on (001) ionic surfaces: Implications for Kelvin probe force microscopy Phys. Rev. B, 78, (2008), 035410, pdf. |
| Th. Glatzel, M. Rusu, S. Sadewasser, and M.Ch. Lux-Steiner Surface photovoltage analysis of thin CdS layers on polycrystalline chalcopyrite absorber layers by Kelvin probe force microscopy Nanotechnology, 19, (2008), 145705, pdf. |
| Th. Glatzel, L. Zimmerli, and E. Meyer Molecular assemblies on insulating ultrathin films analyzed by nc-AFM and KPFM Israel Journal of Chemistry, 48, (2), (2008), 107-116, pdf. |
| S. Sadewasser and Th. Glatzel Comment on ‘‘Electrostatic Force Microscopy on Oriented Graphite Surfaces: Coexistence of Insulating and Conducting Behaviors” Phys. Rev. Lett., 98, (2007), 269701, pdf. |
| L. Zimmerli, S. Maier, Th. Glatzel, E. Gnecco, O. Pfeiffer, F. Diederich, L. Fendt and E. Meyer Formation of molecular wires on nanostructured KBr J. Phys.: Conf. Series, 61, (2007), 1357-1360, pdf. |
| S. Maier, O. Pfeiffer, Th. Glatzel, E. Meyer, T. Filleter, and R. Bennewitz Asymmetry in the reciprocal epitaxy of NaCl and KBr Phys. Rev. B, 75, (2007), 195408. |
| A. Rao, M. Schoenenberger, E. Gnecco, Th. Glatzel, E. Meyer, D. Brändlin and L. Scandella Characterization of nanoparticles using Atomic Force Microscopy J. Phys.: Conf. Series, 61, (2007), 971–976, pdf. |
| G. Hanna, Th. Glatzel, S. Sadewasser, N. Ott, H. P. Strunk, U. Rau, J.H. Werner Texture and Electronic Activity of Grain Boundaries in Polycrystalline Cu(In,Ga)Se2 Thin Films Appl. Phys. A, 82, (2006), 1-7 , pdf. |
| Ch.-H. Fischer, M. Bär, Th. Glatzel, I. Lauermann and M.C. Lux-Steiner Interface Engineering in Chalcopyrite Thin Film Solar Devices Solar Energy Materials and Solar Cells, 90, (10), (2006), 1471-1485, pdf. |
| M. Rusu, Th. Glatzel, A. Neisser, C. A. Kaufmann, S. Sadewasser, and M. Ch. Lux-Steiner Formation of the PVD-CdS/Cu(In,Ga)Se2 interface in highly-efficient thin film solar cells Appl. Phys. Lett., 88, (2006), 143510 , pdf. |
| D. Fuertes Marrón, S. Sadewasser, A. Meeder, Th. Glatzel, and M.Ch. Lux-Steiner Electrical activity at grain boundaries of Cu(In,Ga)Se2 thin films Phys Rev. B, 17, (2), (2005), 033306 , pdf. |
| Th. Glatzel, H. Steigert, S. Sadewasser, R. Klenk, and M.Ch. Lux-Steiner Potential Distribution of Cu(In,Ga)(S,Se)2 - Solar Cell Cross-Sections Measured by Kelvin Probe Force Microscopy Thin Solid Films, 480-481, (2005), 177-182, pdf. |
| H. Hoppe, T. Glatzel, M. Niggeman, M. Ch. Lux-Steiner, N. S. Sariciftci Kelvin Probe Force Microscopy Study on Bulk Heterojunction Conjugated Polymer/Fullerene Organic Solar Cells Nano Letters, 5, (2), (2005), 269-274, pdf. |
| D. Fuertes Marrón, A. Meeder, S. Sadewasser, R. Würz, C.A. Kaufmann, Th. Glatzel, Th. Schedel-Niedrig, and M. Ch. Lux-Steiner Lift-off process and rear-side characterization of CuGaSe2 chalcopyrite thin films and solar cells J. Appl. Phys., 97 , (2005), 094915 , pdf. |
| Thilo Glatzel, Harald Hoppe, Niyazi S. Sariciftci, Martha Ch. Lux-Steiner, Masaharu Komiyama Kelvin Probe Force Microscopy Study on Conjugated Polymer/Fullerene Organic Solar Cells Jap. J. Appl. Phys., 44, (7B), (2005), 5370–5373, pdf. |
| A. Schwarzman, E. Grunbaum, E. Strassburg, E. Lepkifker, A. Boag, Y. Rosenwaks, Th. Glatzel, Z. Barkay, M. Mazzer and K. Barnham Nanoscale potential distribution across multiquantum well structures: Kelvin probe force microscopy and secondary electron imaging J. Appl. Phys., 98 , (2005), 084310 , pdf. |
| Y.Rosenwaks, R. Shikler, Th. Glatzel and S. Sadewasser Kelvin probe force microscopy of semiconductor surface defects Phys. Rev. B, 70, (2004), 085320 , pdf. |
| D. Fuertes Marrón, Th. Glatzel, A. Meeder, Th. Schedel-Niedrig, S. Sadewasser, and M.Ch. Lux-Steiner Electronic structure of secondary phases in Cu-rich CuGaSe2 solar cell devices Appl. Phys. Lett., 85, (17), (2004), 3755-3757 , pdf. |
| O. Douhéret, S. Anand, Th. Glatzel, K. Maknys, and S. Sadewasser Characterization of quantum wells by cross-sectional Kelvin probe force microscopy Appl. Phys. Lett., 85, (2004), 5245-5247, pdf. |
| Th. Glatzel, S. Sadewasser, R. Shikler, Y. Rosenwaks, and M. Ch. Lux-Steiner Kelvin Probe Force Microscopy on III-V Semiconductors: The Effect of Surface Defects on the Local Work Function Materials Science & Engineering B, 102, (2003), 138 , pdf. |
| S. Sadewasser, Th. Glatzel, S. Schuler, S. Nishiwaki, R. Kaigawa, M. Ch. Lux-Steiner Kelvin Probe Force Microscopy for the Nano Scale Characterization of Chalcopyrite Solar Cell Materials and Devices Thin Solid Films, 431-432, (2003), 257 , pdf. |
| Th. Glatzel, S. Sadewasser, and M. Ch. Lux-Steiner Amplitude or Frequency Modulation – Detection in Kelvin Probe Force Microscopy Appl. Surf. Sci., 210, (2003), 84 , pdf. |
| S. Sadewasser, Th. Glatzel, R. Shikler, Y. Rosenwaks, and M. Ch. Lux-Steiner Resolution of Kelvin Probe Force Microscopy in Ultrahigh Vacuum: Comparison of Experiment and Simulation Appl. Surf. Sci., 210, (2003), 32 , pdf. |
| Sascha Sadewasser, Philippe Carl, Thilo Glatzel, and Martha Ch. Lux-Steiner Influence of residual electrostatic force on height measurements in NC-AFM Nanotechnology, 15, (2), (2003), S14 - 18, pdf. |
| N. Duhayon, P.Eyben, M. Fouchier, T. Clarysse, W. Vandervorst, D.Alvarez, S. Schoemann, M.Ciappa, M. Stangoni, P. Formanek, V. Raineri, F. Giannazzo, D. Goghero, Y. Rosenwaks, R. Shikler, S. Saraf, S. Sadewasser, N. Barreau, T. Glatzel, M. Verheijen, S.A.M. Mentink, R. Wiesendanger, M. Von Sprekselen, T. Maltezopoulos, L. Hellemans Assessing the performance of two dimensional dopant profiling techniques J. of Vac. Sci Technol. B, 22, (1), (2003), 385 , pdf. |
| M. Rusu, S. Sadewasser, Th. Glatzel, P. Gashin, A. Simashkevich and A. Jäger-Waldau Contribution of the ZnSe/CuGaSe2 Heterojunction in Photovoltaic Performances of Chalcopyrite Based Solar Cells Thin Solid Films, 403-404, (2002), 344 , pdf. |
| S. Sadewasser, Th. Glatzel, M. Rusu, A. Jäger-Waldau, and M. Ch. Lux-Steiner High resolution work function imaging of single grains of semiconductor surfaces Appl. Phys. Lett., 80, (2002), 2979 , pdf. |
| S. Sadewasser, and Th. Glatzel Work Function Imaging using Kelvin Probe Force Microscopy Bulletin of the Microscopy Society of Canada, 30, (2002), 19 . |
| Th. Glatzel, D. Fuertes Marrón, Th. Schedel-Niedrig, S. Sadewasser, and M. Ch. Lux-Steiner CuGaSe2 solar cell cross section studied by Kelvin probe force microscopy in ultrahigh vacuum Appl. Phys. Lett., 81, (2002), 2017 , pdf. |
| M. Rusu, S. Sadewasser, Th. Glatzel, P. Gashin, A. Jäger-Waldau , A. Simashkevich and M. Ch. Lux-Steiner Interface Characterization of Flash and CVD Prepared ZnSe/CuGaSe2 Heterojunctions Moldavian. J. Phys. Sci., 1, (2002), 124 . |
| Ch. Sommerhalter, S. Sadewasser, Th. Glatzel, Th.W. Matthes, A. Jäger-Waldau, and M.Ch. Lux-Steiner Kelvin Probe Force Microscopy for the Characterization of Semiconductor Surfaces in Chalcopyrite Solar Cells Surface Science, 482-485, (2001), 1362 , pdf. |
| S. Sadewasser, Th. Glatzel, M. Rusu, A. Meeder, D. Fuertes Marrón, A. Jäger-Waldau, M.Ch. Lux-Steiner Characterization of the ZnSe/CuGaSe2 interface using Kelvin Probe Force Microscopy Mater. Res. Soc. Symp. Proc., 668, (2001), H5.4.1. |
| Ch. Sommerhalter, Th. Glatzel, Th.W. Matthes, A. Jäger-Waldau, and M.Ch. Lux-Steiner Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces Applied Surface Science, 157, (2000), 263-268, pdf. |
| Ch. Sommerhalter, Th. W. Matthes, Th. Glatzel, A. Jäger-Waldau, and M. Ch. Lux-Steiner High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy Appl. Phys. Lett., 75, (2), (1999), 286 , pdf. |