Basel Universität

Martin Guggisberg


Loppacher Ch., M. Guggisberg, O. Pfeiffer, E. Meyer, M. Bammerlin, R. Lüthi, R. Schlittler, J. K. Gimzewski, H. Tang and C. Joachim 
Direct Determination of the Energy Required to Operate a Single Molecule Switch 
Phys. Rev. Lett., 90, (2003), 066107.
E. Meyer, R. Bennewitz, O. Pfeiffer, V. Barwich, M. Guggisberg, S. Schär, M. Bammerlin, C. Loppacher, U. Gysin, C.Wattinger, A. Baratoff 
Dissipation mechanisms studied by dynamic force microscopies 
Fundamentals of Tribology and Bridging the Gap Between the M, (2001), 67-81.
R. Bennewitz, A.S. Foster, L.N. Kantorovich, M. Bammerlin, Ch. Loppacher, S. Schär, M. Guggisberg, E. Meyer, A.L. Shluger 
Atomically Resolved Edges and Kinks of NaCl islands on Cu(111): Experiment and Theory 
Phys. Rev. B, 62, (2000), 2074.
O. Pfeiffer, C. Loppacher, C. Wattinger, M. Bammerlin, U. Gysin, M. Guggisberg, R. Bennewitz, E. Meyer, H.-J Güntherodt 
Using higher flexural modes in non-contact force microscopy 
Appl. Surf. Sci., 127, (2000), 337.
V. Barwich, M. Bammerlin, A. Baratoff, R. Bennewitz, M. Guggisberg, C. Loppacher, O. Pfeiffer, E. Meyer, H.-J. Güntherodt, J.-P. Salvetat, J.-M. Bonard, and L. Forró 
Carbon Nanotubes as Tips in Non-contact SFM 
Appl. Surf. Sci., 127, (2000), 269.
M. Guggisberg, M. Bammerlin, Ch. Loppacher, O. Pfeiffer, A. Abdurixit, V. Barwich, R. Bennewitz, A. Baratoff, E. Meyer and H.-J. Güntherodt 
Separation of interactions by non-contact force microscopy 
Phys. Rev. B, 61, (2000), 11151.
M. Guggisberg, M. Bammerlin, A. Baratoff, R. Lüthi, Ch. Loppacher, F.M. Battiston, J. Lü, R. Bennewitz, E. Meyer and H.-J. Güntherodt 
Dynamic force microscopy across steps on the Si(111)7x7 surface 
Surface Science, 127, (2000), 255.
C. Loppacher, R. Bennewitz, O. Pfeiffer, M. Guggisberg, M. Bammerlin, S. Schär, V. Barwich, A. Baratoff and E. Meyer 
Experimental aspects of dissipation force microscopy 
Phys. Rev. B, 62, (2000), 13674.
C. Loppacher, M. Bammerlin, M. Guggisberg, S. Schär, R. Bennewitz, A. Baratoff, E. Meyer, and H.-J. Güntherodt 
Dynamic force microscopy of copper surfaces- Atomic resolution and distance dependence of tip-sample interaction and tunneling current 
Phys. Rev. B, 62, (2000), 16944.
L. Scandella, E. Meyer, L. Howald, R. Lüthi, M. Guggisberg, J. Gobrecht and H.-J. Güntherodt 
Friction Forces on hydrogen passivated (110) silicon and silicon dioxides by scanning force microscopy 
J. Vac. Sci.Technol. B, 14, (1996), 1255.