Basel Universität

Room Temperature Atomic Force Microscope for Friction Force studies



In order to study Friction phenomena and the isotropy of friction, we have developed dedicated RT AFM microscope and sample holder. The microscope head and the sample holder allowing sample rotation have been developed during the phd thesis of Dr Gregor Fessler.
The microscope is also used in the non contact mode both at fundamental resonnance and higher harmonics
Current topics are studies on C60 island on organic layered crystals and NiO surface.

On the left, a top view of the RTAFM head is presented. The different color present the different area. Red : Sample slider
Green : Cantilever holder
Yellow : Optic fiber
Orange : 4 quadrant photodiode
Dark Blue : Mirors
Light Blue : Switch STM/AFM

On the left, the sample holder developed for isotropy of friction studies. With this holder we are able to rotate the sample in order to study friction along differents surface directions.

Optical detection for cantilever oscillation is achieved with a 4-quadrant photodiode. Light for the optical detection is emitted from a superlum diode equipped with two wavelength, a red (678,5nm) and an infra red (830,6nm), and introduced in UHV via an optical fiber. At the fiber output, in UHV, laser beam is focused with the help of optical lenses. The geometry of the optical path as well as the optical fiber was optimized since the first RTAFM developed in the lab.



Publications related to this instrument:

Anchoring of a dye precursor on p-type NiO(100) studied by RT nc-AFM
S. Freund, A. Hinaut, E. C. Constable, E. Meyer, C. E. Housecroft and Th. Glatzel
QMol 2017, 2017-09-11, Ascona, (Switzerland), Abstract (PDF).
Etude nc-AFM a temperature ambiante de l ancrage d un precurseur de pigments photosensibles sur le semi-conducteur de type p NiO(100)
S. Freund , A. Hinaut, E. C. Constable, E. Meyer, C. E. Houscroft et Th. Glatzel
Forum des Microscopies a Sonde Locale, 2017-03-20, Montpellier, (France).
Anchoring of a dye precursor on p-type NiO(100) studied by RT nc-AFM
S. Freund, A. Hinaut, E. C. Constable, E. Meyer, C. E. Houscroft et Th. Glatzel
SAOG, 2017-01-27, Fribourg, (Switzerland).
Force microscopy study of C60 islands on organic compound crystals
S. Freund, A. Hinaut, R. Pawlak, S.-X. Liu, S. Decurtins, E. Meyer and Th. Glatzel
611. WE-Heraeus-Seminar: Mechanisms of Tribology, 2016-03-29, Bad Honnef, (Germany), Abstract (PDF).
Etude nc-AFM d ilots de C60 formes sur un cristal moleculaire organique
S. Freund , A. Hinaut, R. Pawlak, S.-X. Liu, S. Decurtins, E. Meyer and Th. Glatzel
Forum des microscopies a sonde locale 2016, 2016-03-21, Sochaux, (France), Abstract (PDF).
Morphology Change of C60 Islands on Organic Crystals Observed by Atomic Force Microscopy
S. Freund, A. Hinaut, R. Pawlak, S.-X. Liu, S. Decurtins, E. Meyer and Th. Glatzel
ACS Nano, 10, (6), (2016), 5782–5788, pdf.
Patterning of C60 Islands on Organic Layer Compound Crystals
Th. Glatzel S. Freund, A. Hinaut, R. Pawlak, Shi-Xia Liu, S. Decurtins, E. Meyer and
8th International Workshop on Nanoscale Pattern Formation at Surfaces, 2015-07-14, Krakow, (Poland), Abstract (PDF).
nc-AFM study of C60 islands on organic compound crystals
S. Freund , A. Hinaut, R. Pawlak, S.-X. Liu, S. Decurtins, E. Meyer and Th. Glatzel
DPG Spring Meeting, 2015-03-19, Berlin, (Germany), Abstract (PDF).
Force microscopy study of C60 islands on organic compound crystals
S. Freund, A. Hinaut, R. Pawlak, S.-X. Liu, S. Decurtins, E. Meyer and Th. Glatzel
The International Conference on Understanding and Controlling Nano and Mesoscale Friction, 2015-06-24, Istanbul, (Turkey), Abstract (PDF).
nc-AFM study of C60 islands on organic layer compound crystals
S. Freund, A. Hinaut, R. Pawlak, S.-X. Liu, S. Decurtins, E. Meyer and Th. Glatzel
5th European Nanomanipulation Workshop, 2014-06-18, Basel/Mulhouse, (Switzerland/France), Abstract (PDF).
UHV-AFM measurments of C60 molecules on organic layer materials
S. Freund, (2014), Abstract (PDF).
Friction force microscopy studies on SiO2 supported pristine and hydrogenated graphene
G. Fessler, B. Eren, U. Gysin, Th. Glatzel, and E. Meyer
Appl. Phys. Lett., 104, (4), (2014), 041910, pdf.
Orientation dependent molecular friction on organic layer compound crystals
G. Fessler, I. Zimmermann, Th. Glatzel, E. Gnecco, P. Steiner, R. Roth, T. D. Keene, S.-X. Liu, S. Decurtins, and E. Meyer
Appl. Phys. Lett., 98, (8), (2011), 083119, pdf.
nc-AFM study of C60 islands on organic compound crystals
S. Freund, A. Hinaut, R. Pawlak, S.-X. Liu, S. Decurtins, E. Meyer and Th. Glatzel
18th International Conference on non contact Atomic Force Microscopy, 2015-09-09, Cassis, (France), Abstract (PDF).
Cutting and self-healing molecular wires studied by dynamic force microscopy
S. Kawai, S. Maier, Th. Glatzel, S. Koch, B. Such, L. Zimmerli, L.-A. Fendt, F. Diederich, and E. Meyer
Appl. Phys. Lett., 95, (2009), 103109, pdf.