Dilek Yildiz
PhD student MSc. Physics office 3.02 tel +41 (0)61 207 3727 |
Research interests
Publications
Latest Papers (show all)
Mechanical dissipation via image potential states on a topological insulator surface Dilek Yildiz, Marcin Kisiel, Urs Gysin, Oguzhan Gürlü, Ernst Meyer Nature Materials, 18, (2019), 1201â1206, pdf. |
Mechanical dissipation from charge and spin transitions in oxygen-deficient SrTiO3 surfaces Marcin Kisiel, Oleg Brovko, Dilek Yildiz, Remy Pawlak, Urs Gysin, Erio Tosatti, Ernst Meyer Nature Communication, 9, (2018), 2946, pdf. |
Apparent corrugation variations on moire patterns on highly oriented pyrolytic graphite D. Yildiz and O. Gurlu Materials Today Communications, 8, (2016), 72-78. |
Latest Talks (show all)
Electronic and frictional properties of Bi2Te3 (0001) surface D. Yildiz , M. Kisiel, and E. Meyer 13th International Nanoscience & Nanotechnology Conference, 2017-10-22, Antalya, (Turkey). |
Image states and energy dissipation on Bi2Te3 surface D. Yildiz , M. Kisiel, and E. Meyer Trends in Nanotribology 2017, 2017-06-26, Trieste, (Italy). |
Energy dissipation peaks on Bi2Te3 studied with pendulum AFM and STM D. Yildiz , M. Kisiel, and E. Meyer Seminar (Osaka University), 2017-05-24, Osaka, (Japan). |
Image States and Energy Dissipation in Bi2Te3 Surface D. Yildiz , M. Kisiel, and E. Meyer Seminar (University of Tokyo), 2017-05-23, Tokyo, (Japan). |
Latest Poster (show all)
Energy dissipation peaks on Bi2Te3 studied with pendulum AFM and STM D. Yildiz, M. Kisiel, and E. Meyer SNI Annual meeting 2017, 2017-09-07, Lenzerheide, (Switzerland). |
Electrostatic, phononic and van der Waals friction on layered materials D. Yildiz, M. Kisiel, and E. Meyer DPG Spring Meeting, 2017-03-19, Dresden, (Germany). |
Electronic and van der Waals friction on layered structures D. Yildiz, M. Kisiel, and E. Meyer Nanoscience in the Snow 2017, 2017-01-25, Zermatt, (Switzerland). |
Energy Dissipation Mechanism On Layered Structures D. Yildiz, M. Kisiel, and E. Meyer International Non-contact Atomic Force Microscopy (NC-AFM), 2016-07-25, Nottingham, (UK). |