Martin Guggisberg
Publications
Loppacher Ch., M. Guggisberg, O. Pfeiffer, E. Meyer, M. Bammerlin, R. Lüthi, R. Schlittler, J. K. Gimzewski, H. Tang and C. Joachim Direct Determination of the Energy Required to Operate a Single Molecule Switch Phys. Rev. Lett., 90, (2003), 066107. |
E. Meyer, R. Bennewitz, O. Pfeiffer, V. Barwich, M. Guggisberg, S. Schär, M. Bammerlin, C. Loppacher, U. Gysin, C.Wattinger, A. Baratoff Dissipation mechanisms studied by dynamic force microscopies Fundamentals of Tribology and Bridging the Gap Between the M, (2001), 67-81. |
R. Bennewitz, A.S. Foster, L.N. Kantorovich, M. Bammerlin, Ch. Loppacher, S. Schär, M. Guggisberg, E. Meyer, A.L. Shluger Atomically Resolved Edges and Kinks of NaCl islands on Cu(111): Experiment and Theory Phys. Rev. B, 62, (2000), 2074. |
O. Pfeiffer, C. Loppacher, C. Wattinger, M. Bammerlin, U. Gysin, M. Guggisberg, R. Bennewitz, E. Meyer, H.-J Güntherodt Using higher flexural modes in non-contact force microscopy Appl. Surf. Sci., 127, (2000), 337. |
V. Barwich, M. Bammerlin, A. Baratoff, R. Bennewitz, M. Guggisberg, C. Loppacher, O. Pfeiffer, E. Meyer, H.-J. Güntherodt, J.-P. Salvetat, J.-M. Bonard, and L. Forró Carbon Nanotubes as Tips in Non-contact SFM Appl. Surf. Sci., 127, (2000), 269. |
M. Guggisberg, M. Bammerlin, Ch. Loppacher, O. Pfeiffer, A. Abdurixit, V. Barwich, R. Bennewitz, A. Baratoff, E. Meyer and H.-J. Güntherodt Separation of interactions by non-contact force microscopy Phys. Rev. B, 61, (2000), 11151. |
M. Guggisberg, M. Bammerlin, A. Baratoff, R. Lüthi, Ch. Loppacher, F.M. Battiston, J. Lü, R. Bennewitz, E. Meyer and H.-J. Güntherodt Dynamic force microscopy across steps on the Si(111)7x7 surface Surface Science, 127, (2000), 255. |
C. Loppacher, R. Bennewitz, O. Pfeiffer, M. Guggisberg, M. Bammerlin, S. Schär, V. Barwich, A. Baratoff and E. Meyer Experimental aspects of dissipation force microscopy Phys. Rev. B, 62, (2000), 13674. |
C. Loppacher, M. Bammerlin, M. Guggisberg, S. Schär, R. Bennewitz, A. Baratoff, E. Meyer, and H.-J. Güntherodt Dynamic force microscopy of copper surfaces- Atomic resolution and distance dependence of tip-sample interaction and tunneling current Phys. Rev. B, 62, (2000), 16944. |
L. Scandella, E. Meyer, L. Howald, R. Lüthi, M. Guggisberg, J. Gobrecht and H.-J. Güntherodt Friction Forces on hydrogen passivated (110) silicon and silicon dioxides by scanning force microscopy J. Vac. Sci.Technol. B, 14, (1996), 1255. |