Sascha Koch
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PhD student Diploma in Physics office 3.02 tel +41 (0)61 267 3727 more... |
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Research interests
NC-AFM, KPFM, STM, Molecular Eletronics
Publications
| S. Kawai, Th. Glatzel, S. Koch, A. Baratoff, and E. Meyer Interaction-induced atomic displacements revealed by drift-corrected dynamic force spectroscopy Phys. Rev. B, 83, (3), (2011), 035421, pdf. |
| H. Karacuban, S. Koch, M. Fendrich, Th. Wagner and R. Möller PTCDA on Cu(111) partially covered with NaCl Nanotechnology, 22, (29), (2011), 9, pdf. |
| S. Kawai, Th. Glatzel, S. Koch, B. Such, A. Baratoff, and E. Meyer Ultrasensitive detection of lateral atomic-scale interactions on graphite (0001) via bimodal dynamic force measurements Phys. Rev. B, 81, (8), (2010), 085420, pdf. |
| B. Such, Th. Glatzel, S. Kawai, S. Koch, and E. Meyer Three-dimensional force spectroscopy of KBr(001) by tuning fork-based cryogenic noncontact atomic force microscopy J. Vac. Sci. Technol. B, 28, (3), (2010), C4B1, pdf. |
| L. Gross, R. R. Schlittler, G. Meyer, L.-A. Fendt, F. Diederich, Th. Glatzel, S. Kawai, S. Koch, and E. Meyer Contacting self-ordered molecular wires by nanostencil lithography J. Vac. Sci. Technol. B, 28, (3), (2010), C4D34, pdf. |
| Th. Glatzel, L. Zimmerli, S. Koch, S. Kawai, E. Meyer Molecular assemblies grown between metallic contacts on insulating surfaces Appl. Phys. Lett., 94, (2009), 3, pdf. |
| T. Glatzel, L. Zimmerli, S. Koch, B. Such, S. Kawai and E. Meyer Determination of effective tip geometries in Kelvin probe force microscopy on thin insulating films on metals Nanotechnology, 20, (26), (2009), 264016, pdf. |
| S. Kawai, Th. Glatzel, S. Koch, B. Such, A. Baratoff, and E. Meyer Time-averaged cantilever deflection in dynamic force spectroscopy Phy. Rev. B, 80, (8), (2009), 085422, pdf. |
| S. Kawai, S. Maier, Th. Glatzel, S. Koch, B. Such, L. Zimmerli, L.-A. Fendt, F. Diederich, and E. Meyer Cutting and self-healing molecular wires studied by dynamic force microscopy Appl. Phys. Lett., 95, (2009), 103109, pdf. |
| S. Kawai, Th. Glatzel, S. Koch, B. Such, A. Baratoff, and E. Meyer Systematic Achievement of Improved Atomic-Scale Contrast via Bimodal Dynamic Force Microscopy Phys. Rev. Lett., 103, (2009), 220801, pdf. |